Humble planar defects in SiGe nanopillars
نویسندگان
چکیده
We report a new \{001\} planar defect found in SiGe nanopillars. The structure, determined by atomic resolution electron microscopy, matches the Humble model proposed for diamond. also investigated several possible variants of structure using first principles calculations and that one lowest energy was best agreement with STEM images. pillar composition has been analyzed loss spectroscopy, which hints at how is formed. Our results show formation process defects nanostructured group IV semiconductors can be different from their bulk counterparts.
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ژورنال
عنوان ژورنال: Physical review
سال: 2022
ISSN: ['0556-2813', '1538-4497', '1089-490X']
DOI: https://doi.org/10.1103/physrevb.106.054114